The article "Calibration of an FTIR Spectrometer" (P. Pankratz, Statistical Case Studies for Industrial and Process Improvement, SIAM-ASA, 1997: 19–38) describes the use of a spectrometer to make five measurements of the carbon content (in ppm of a certain silicon wafer whose true carbon content was known to be 1.1447 ppm. The measurements were 1.0730, 1.0825, 1.0711.1.0870, and 1.0979.
a. Is it possible to estimate the uncertainty .in these measurements? If so, estimate it. If not, explain why not.
b. Is it possible to estimate the bias in these measurements? If so. estimate it. If not. explain why not.
