The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 14 defectives. Calculate a 95% two-sided confidence interval on the fraction of defective circuits produced by this particular tool. Round the answers to 4 decimal places.

Respuesta :

Answer: [tex](0.0228\ ,0.0706)[/tex]

Step-by-step explanation:

Given : Sample size : n= 300

The sample proportion of defectives : [tex]\hat{p}=\dfrac{14}{300}=0.0467[/tex]

Significance level for 95% confidence level =[tex]\alpha=1-0.95=0.05[/tex]

Critical z-value:[tex]z_{\alpha/2}=\pm1.96[/tex]

Confidence interval for population proportion :

[tex]\hat{p}\pm z_{\alpha/2}\sqrt{\dfrac{\hat{p}(1-\hat{p})}{n}}[/tex]

[tex]= 0.0467\pm (1.96)\sqrt{\dfrac{0.0467(1-0.0467)}{300}}[/tex]

[tex]\approx\ 0.0467\pm 0.0239\\\\=(0.0467-0.0239\ , \ 0.0467-0.0239)\\\\=(0.0228\ ,0.0706)[/tex]

Hence, a 95% two-sided confidence interval on the fraction of defective circuits produced by this particular tool= [tex](0.0228\ ,0.0706)[/tex]

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